The Fischerscope X-Ray XDV-SDD is a universally applicable energy-dispersive X-ray fluorescence measuring device. It is predestined for the measurement and analysis of very thin layers or small concentration values in trace analysis. With the high-precision programmable X/Y stage and the fast loading, it is optimally suited for automated sample measurement.
Typical applications are:
- Analysis of thin and very thin coatings, e.g. gold/palladium layers of ≤ 0.1 µm.
- Trace analysis on printed circuit boards according to RoHS and WEEE requirements
- Gold analysis
- Measurement of functional layers in the electronics and semiconductor industry
- Determination of complex multilayer systems
- Automated measurements e.g. in quality control